MRS Electronic
MRS Electronic

Fully Automated Test Line

Automatic measuring machines and test systems are used to check quality during the production of power semiconductors.

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Fully Automated Test Line
up to 175 °C
Hot and room temperature testing
8
Integrated test steps
100%
Unit-level traceability
EOL
Complete line automation

Our Solutions

Eight modular test stations, combined into one seamless line, tailored to your power module specifications.

Isolation Test

Isolation Test

High-voltage insulation checks to guarantee complete electrical safety of every power module.

Static Test

Static Test

Precise electrical parameter measurement

Dynamic Test

Dynamic Test

Switching behavior verification, including hot testing at high-stress points up to 175 degrees C.

Optical and Tactile

Optical and Tactile

Automated visual inspection and tactile dimension verification.

Leakage Test

Leakage Test

Reliable seal and leak-tightness verification of housing and heat sink.

Laser Marking

Laser Marking

Permanent unit identification with unique laser-etched data-matrix codes including pass/fail marker

Robot Handling

Robot Handling

Fully automated module handling and pick-and-place tracking between line stations.

Heating & Cooling

Heating & Cooling

Module specific fixtures and adaptive stations for heating and cooling in the line.

The Testing Process

All MRS Test Systems can be integrated in a testline

Line Control / Traceability

  • Integrated line computer controlling and monitoring every process and test step in real-time.
  • Automated secure time stamps recorded for each individual test and laser process.
  • Direct secure database handshake with client ERP / MES infrastructure.
  • Centralized test program configuration.
  • Live OEE performance analytics, yield reports, and top failure rankings.

HMI - Test Line Control

HIPOT Test 00009 PASS
Static Test 00009 PASS
Dynamic Test 00009 PASS
Leakage Test 00009 PASS
Laser Marking 00009 PASS

Die (KGD)

Si / SiC / GaN

Diode

Z Diodes / High Voltage Diodes / ULLD / ARD ...

FET

Si / SiC / GaN

IGBT

Silicon (Si)

Bridges / Modules

Half Bridge, Full Bridge and Rectifiers

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Other Automation Solutions

Lab

Full measurement capability in a compact, operator-loaded setup ideal for development, validation and low volumes.

  • Flexible laboratory test stations built for manual contacting, climate chamber integration and customer-defined parallel testing
  • Interchangeable test-adapters ensuring universal compatibility across diodes, halfbridges, rectifiers and FET/IGBT modules
  • Operator-loaded setups featuring secure manual contacting stations with integrated safety interlocks and visual status indicators

Drawer Station

Secure manual testing station enabling sequential multiplexing and evaluation for any power semiconductor package.

  • Universal compatibility for diodes, IGBTs, FET modules and Si/SiC devices via easily exchangeable test-adapters
  • Automated 4-wire contacting (pogo pin or gripper) with secure drawer locking during active testing
  • Smart visual status indicators with automatic release for passed components and mandatory manual fail acknowledgment
  • Integrated hardware for fixed or handheld Data Matrix scanning to ensure complete traceability
  • Built-in integration for label printers or direct inkjet marking

Diode Handler

Automated feeding, straightening, measuring and sorting system optimized for high-volume diode processing.

  • High-capacity vibration bowl feeder processing up to 90 parts per minute
  • Integrated head wire straightener and separator for precise gap control and cutting
  • Spring-loaded, four-contact (force and sense) for reliable measuring
  • Automated mechanical sorting into four approved categories or specific fault rejections
  • Built-in integration for inkjet marking

Automation Technology Partner

CRS Prüftechnik

www.crs-prueftechnik.de

Reichenaustraße 242 78467 Konstanz Germany

Barth Mechanik

www.barth-mechanik.de

Barth Mechanik GmbH Alte Flözlinger Straße 4 78658 Zimmern o.R. Germany

Planning your next semiconductor tester?

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