Our high precision, flexible custom solutions are designed around your needs and for your individual requests.
Each custom system is engineered to your exact specifications. For example Reliability tests like HTRB, HTGB, H3TRB, HTOL or other tests like special ZTH and Power Cycling.
ZTH Tester
Thermal impedance measurement at up to 150 A, on single devices, modules and custom stack-ups.
Zth and Zth loop plus the full static set like BVDSS, IDSS / DIDSS, IGSS / DIGSS, VGSTH, RDSON with contact check.
HTRB / HTGB Tester
High Temperature Reverse Bias and Gate Bias testing at ± 6500 V and 200 °C.
In the picture it's all in one solution for 4 DUTs, we are able to use a separate oven for testing DUTs between 20-100. Runs 72 h independently of the PC, with high-voltage supplies, temperature regulators, separate heating and cooling per DUT, and a dedicated safety system.
HTOL Tester
High Temperature Operating Life testing to JEDEC standards over 100–1000 h.
Up to 80 DUTs in a heating chamber to 260 °C, with high-power supplies, an oscilloscope, a multiplexer for V-measurement and a current limitation per DUT.
Thermal Cycling Diode Tester
Stress-tests rectifier diodes with high-current pulses up to 200 A while monitoring forward voltage to track junction temperature.
16 independent positions run 500+ hours, with programmable cycle patterns and per-product contact units.
and many more...
as per your requirements.
Diode
Z Diodes / High Voltage Diodes / ULLD / ARD ...
FET
Si / SiC / GaN
IGBT
Silicon (Si)
Bridges / Modules
Half Bridge, Full Bridge and Rectifiers
Die (KGD)
Si / SiC / GaN
Lifecycle services
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